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Product category: Intellectual Property Cores
News Release from: LogicVision Europe | Subject: ETMemory
Edited by the Electronicstalk Editorial Team on 27 June 2006

Embedded tests enhance memory
reliability

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LogicVision and Dolphin Technology have developed an integrated and comprehensive self-testable and self-repairable memory solution for advanced nanometre designs.

LogicVision and Dolphin Technology have developed an integrated and comprehensive self-testable and self-repairable memory solution for advanced nanometre designs The integrated solution consists of Dolphin's high performance 90 and 65nm memories and LogicVision's recently announced ETMemory solutions