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Product category: ATE Systems
News Release from: Kingston Technology
Edited by the Electronicstalk Editorial Team on 28 July 2005

Dynamic burn-in tester wins US Patent

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Kingston Technology has been granted a US Patent for its KT2400 dynamic burn-in tester.

Kingston Technology has been granted a US Patent (6,910,162 B2) for its KT2400 dynamic burn-in tester This proprietary testing platform is designed to detect early-life failures (ELF) in server memory modules, taking quality assurance to a new level of excellence