Debug probe has USB 2.0 high-speed interface

An IAR Systems product story
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Edited by the Electronicstalk editorial team Jul 16, 2010

IAR Systems has announced the availability of its J-Link Ultra debug probe for use with ARM Cortex devices.

This JTAG/SWD probe supports IAR's latest power debugging technology that is available within IAR Embedded Workbench.

The J-Link Ultra JTAG/SWD debug probe features a USB 2.0 Hi-Speed interface, SWO frequency up to 25MHz and JTAG speeds up to 25MHz.

By using the probe's capability to measure a target's power consumption, combined with the power debugging technology in IAR Embedded Workbench, it is possible to correlate current sampling alongside program execution and analyse the software's influence on power consumption.

The combination of IAR J-Link Ultra and IAR Embedded Workbench allows developers to optimise the application in order to minimise power consumption.

The probe supports ARM7, ARM9 and ARM11, together with Cortex-M0, -M1, M3, -M4 and -R4 core.

The J-Link Ultra also supports the self-clocking Manchester code, thus removing the need to specify the correct MCU speed in the debugger.

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