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Product category: Stand-Alone Instruments
News Release from: Hitachi High-Technologies (Electron Microscopy) | Subject: S-4300SE/N
Edited by the Electronicstalk Editorial Team on 12 August 2004

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The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument.

The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument The use of a Schottky thermal FE source gives excellent resolution yet also provides sufficient beam current for both EDX and WDX analysis