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Hitachi High-Technologies (Electron Microscopy)

Address: UK
Telephone: (UK) +44 118 932 8632

http://www.hsi-europe.com

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Listing of all 28 news releases from Hitachi High-Technologies (Electron Microscopy):

Electron microscope has resolution for research

Ultra-high-resolution scanning transmission electron microscope is characterised by new electron optics which now include a spherical aberration correction system.

News from Hitachi High-Technologies (Electron Microscopy) (10 January 2007)

TM-1000 on show at Buckingham Palace

Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006.

News from Hitachi High-Technologies (Electron Microscopy) ( 4 December 2006)

Electron optics experts head for Japan

Representatives from the Hitachi organisation throughout the world will be making a significant contribution to the 16th International Microscopy Congress in Japan next month.

News from Hitachi High-Technologies (Electron Microscopy) (17 August 2006)

Large chamber analytical VPSEM launched

Hitachi High-Technologies has announced the launch of the S-3700N variable pressure scanning electron microscope (VPSEM).

News from Hitachi High-Technologies (Electron Microscopy) (14 July 2006)

Tabletop microscope takes a different view

A new tabletop microscope has the potential to transform the field of basic microscopy.

News from Hitachi High-Technologies (Electron Microscopy) (10 April 2006)

Allen expands scope network

Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes.

News from Hitachi High-Technologies (Electron Microscopy) (20 March 2006)

Detector provides a powerful alternative

Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope.

News from Hitachi High-Technologies (Electron Microscopy) (15 November 2005)

Heated holder aids nanoscale research

Hitachi High-Technologies has introduced a directly heated specimen holder for use with the high resolution HD-2300 scanning transmission electron microscope (STEM).

News from Hitachi High-Technologies (Electron Microscopy) ( 8 August 2005)

Microscope gains an extra dimension

A new, five-segment semiconductor backscattered electron detector with high sensitivity and fast response rates has been introduced for the S-3400N variable pressure SEM.

News from Hitachi High-Technologies (Electron Microscopy) (23 May 2005)

SEM boasts subnanometre resolution

The latest addition to the range of scanning electron microscopes from Hitachi High-Technologies claims the world's highest resolution for an SEM.

News from Hitachi High-Technologies (Electron Microscopy) (10 March 2005)

SEM improves display and signal mixing

The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.

News from Hitachi High-Technologies (Electron Microscopy) ( 7 February 2005)

VPSEM boasts outstanding performance

The S-3400N is a new variable pressure scanning electron microscope.

News from Hitachi High-Technologies (Electron Microscopy) (11 October 2004)

SEM boasts outstanding anaysis capabilities

The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument.

News from Hitachi High-Technologies (Electron Microscopy) (12 August 2004)

TEM promises nanometre-level resolution

Outstanding spatial resolution at the nanometre level can be achieved on chemical element mapping in the HD-2300 scanning transmission electron microscope from Hitachi High-Technologies.

News from Hitachi High-Technologies (Electron Microscopy) (30 July 2004)

Microscope resolves to handle 8in wafers

The S-4800 FESEM from Hitachi High-Technologies represents a breakthrough in FESEM technology, offering resolution figures of 1.0nm at 15kV yet capable of handling specimens up to 8in diameter.

News from Hitachi High-Technologies (Electron Microscopy) (28 June 2004)

Beam deceleration boosts resolution

Beam deceleration technology is now an option for the S-4800 field emission scanning electron microscope (FESEM) from Hitachi High-Technologies.

News from Hitachi High-Technologies (Electron Microscopy) (19 May 2004)

Jones demonstrates benefits of electron microscopy

Hitachi High-Technologies has appointed Chris Jones as Applications Specialist and Demonstrator for its Electron Microscopy Division in the UK.

News from Hitachi High-Technologies (Electron Microscopy) (19 March 2004)

Scanning TEM claims 2nm resolution

The new HD-2300 scanning transmission electron microscope offers improved resolution and significantly enhanced analytical capabilities for materials and semiconductor applications.

News from Hitachi High-Technologies (Electron Microscopy) ( 2 February 2004)

TEM warms quickly to its task

The new PC-controlled H-9500 TEM from Hitachi High-Technologies is designed for rapid operation.

News from Hitachi High-Technologies (Electron Microscopy) ( 4 November 2003)

Microscope produces scanning transmission images

The S-5200 ultrahigh-resolution field emission scanning electron microscope can now be equipped with a transmission detector to allow scanning transmission images to be produced.

News from Hitachi High-Technologies (Electron Microscopy) (24 September 2003)

Scope for ultra-high resolution

Detector boosts microscope applications

Ion beam system samples semiconductors

Intel rewards quality improvement

High-resolution FESEM for large samples

Additional detector brings enhanced imaging

SEM gets a better image

Restructuring at Hitachi

 

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