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Product category: Programmable Logic Devices
News Release from: Actel Europe | Subject: Flash-based FPGAs
Edited by the Electronicstalk Editorial Team on 08 August 2006

Study confirms Flash-based FPGA space
performance

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Third-party investigation confirms Flash-based FPGAs are immune to configuration upsets caused by high-energy neutrons naturally generated in the earth's atmosphere.

Actel has announced that a comprehensive third-party investigation confirms that Actel's Flash-based field-programmable gate arrays (FPGAs) are immune to configuration upsets caused by high-energy neutrons naturally generated in the earth's atmosphere The study also determined that advances in semiconductor manufacturing technology have had a detrimental impact on the reliability of SRAM-based FPGAs, making them more vulnerable to neutron-induced configuration loss, a major concern for designers of high-reliability systems such as medical, telecommunications, storage area network (SAN), military and avionics systems

Configuration loss also poses a threat to the quality of high-volume consumer and automotive applications.

The study was conducted in December 2005, by iRoC Technologies at the Los Alamos Neutron Sciences centre (LANSCE) at Los Alamos National Laboratory in New Mexico.

"iRoC Technologies' test service is positioned as a totally independent test h