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Product category: Programmable Logic Devices
News Release from: Actel Europe
Edited by the Electronicstalk Editorial Team on 21 April 2004

Report verifies FPGA radiation immunity

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A new report verifies that FPGAs based on Flash and antifuse technologies are immune to configuration upsets caused by high-energy neutrons naturally generated in the earth's atmosphere.

A comprehensive third-party investigation has verified that FPGAs based on Flash and antifuse technologies are immune to configuration upsets caused by high-energy neutrons naturally generated in the earth's atmosphere The study also determined that SRAM-based FPGAs are vulnerable to neutron-induced configuration loss not only under high-altitude conditions, as traditionally believed, but also in ground-based applications, including automotive, medical, telecommunications, and data storage and communications